An analytical approach to similarity measure selection for selftraining

TitleAn analytical approach to similarity measure selection for selftraining
Publication TypeConference Paper
Year of Publication2013
AuthorsVan Asch, V., & Daelemans W.
Conference NameBENELEARN 2013: Proceedings of the 22nd Belgian-Dutch Conference on Machine Learning
Date Published2013
Conference LocationNijmegen, the Netherlands
Refereed DesignationRefereed
AttachmentSize
paper_2.pdf252.11 KB
poster.pdf218.87 KB
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